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The calculated rate at which device failures will occur within a total device population (normally expressed in terms of percent per thousand hours or devices per 106 unit hours).

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Kalbos dalis: noun
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Blossary:
Pramonės šaka / sritis: Semiconductors
Category: Semiconductor quality
Company: National Semiconductor
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difuzno područje

Semiconductors; Semiconductor quality

A portion of the die where impurities have been diffused into the surface of the silicon at high temperature to change its electrical characteristics through the creation of a ...

primalac

Semiconductors; Semiconductor quality

An impurity that can make a semiconductor P-type by accepting valence electrons, thereby leaving "holes" in the valence band of the semiconductor device. The holes act like ...

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Semiconductors; Semiconductor quality

The step in the fabrication process immediately following evaporation. This process alloys the conductive metal which had been deposited on the die surface to that surface, thus ...

alfa čestica

Semiconductors; Semiconductor quality

Helium nuclei emitted as a result of the radioactive decay of trace amounts of naturally occurring uranium and thorium found in semiconductor packaging materials. Alpha particles, ...